Equotip 550 Leeb Portable Hardness Tester

The Equotip 550 Leeb is a versatile Leeb hardness tester for on-site testing of heavy, large or installed parts. The Equotip 550 Leeb features a rugged touchscreen designed to provide an exceptional user experience and best possible measuring and analysis.

单位550 leeb datasheet

$8,099.70–$9,363.40

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Equotip 550 Leeb D consisting of: Equotip Touchscreen incl. Battery, Equotip Basic Leeb Impact Device D, Impact Body D, Support Rings (D6,D6a), Cleaning Brush, Impact Device Cable, Test Block ~775 HLD\/~56HRC, Coupling Paste, Power Supply, USB-Cable, Surface Roughness Comparator Plate, DVD with Software, Documentation, Carrying Strap and Carrying Case.<\/p>\n","variation_id":6238,"variation_is_active":true,"variation_is_visible":true,"weight":"21","weight_html":"21 lbs"},{"attributes":{"attribute_choose-kit":""},"availability_html":"","backorders_allowed":false,"dimensions":{"length":"20","width":"15","height":"6"},"dimensions_html":"20 × 15 × 6 in","display_price":9363.4,"display_regular_price":9363.4,"image":{"title":"Equotip 550 Leeb Portable Hardness Tester","caption":"","url":"\/wp-content\/uploads\/2017\/11\/equotip_leeb.png","alt":"","src":"\/wp-content\/uploads\/2017\/11\/equotip_leeb-600x365.png","srcset":"\/\/www.game-wii.com\/wp-content\/uploads\/2017\/11\/equotip_leeb-600x365.png 600w, \/\/www.game-wii.com\/wp-content\/uploads\/2017\/11\/equotip_leeb-150x91.png 150w, \/\/www.game-wii.com\/wp-content\/uploads\/2017\/11\/equotip_leeb-300x183.png 300w, \/\/www.game-wii.com\/wp-content\/uploads\/2017\/11\/equotip_leeb-768x467.png 768w, \/\/www.game-wii.com\/wp-content\/uploads\/2017\/11\/equotip_leeb-1024x623.png 1024w, \/\/www.game-wii.com\/wp-content\/uploads\/2017\/11\/equotip_leeb.png 1170w","sizes":"(max-width: 600px) 100vw, 600px","full_src":"\/wp-content\/uploads\/2017\/11\/equotip_leeb.png","full_src_w":1170,"full_src_h":712,"gallery_thumbnail_src":"\/wp-content\/uploads\/2017\/11\/equotip_leeb-100x100.png","gallery_thumbnail_src_w":100,"gallery_thumbnail_src_h":100,"thumb_src":"\/wp-content\/uploads\/2017\/11\/equotip_leeb-150x91.png","thumb_src_w":150,"thumb_src_h":91,"src_w":600,"src_h":365},"image_id":6219,"is_downloadable":false,"is_in_stock":true,"is_purchasable":true,"is_sold_individually":"no","is_virtual":false,"max_qty":"","min_qty":1,"price_html":"$<\/span>9,363.40<\/bdi><\/span><\/span>","sku":"35610003","variation_description":"

Equotip 550 Leeb G consisting of: Equotip Touchscreen incl. Battery, Equotip Basic Leeb Impact Device G, Impact Body G, Support Rings (G6,G6a), Cleaning Brush, Impact Device Cable, Test Block ~570 HLG\/~340HB, Coupling Paste, Power Supply, USB-Cable, Surface Roughness Comparator Plate, DVD with Software, Documentation, Carrying Strap and Carrying Case.<\/p>\n","variation_id":6239,"variation_is_active":true,"variation_is_visible":true,"weight":"21","weight_html":"21 lbs"}]">
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Product Information

The Leeb Measuring Principle – Invented by Proceq

LEEB硬度原理基于动态（反弹）方法。具有硬金属测试尖端的冲击体通过弹簧力抵靠试验片的表面推进。当冲击体击中测试表面时发生表面变形，这导致动能的损失。通过比较速度VI和VR的比较来检测这种能量损失，当冲击机体分别处于距离表面的距离和反弹阶段的精确距离时。

使用冲击体中的永磁体测量速度，该撞击体中的电置电压在线圈中精确地定位在冲击装置中。检测到的电压与冲击体的速度成比例。然后，信号处理提供硬度读数。

Applications

  • Standard to large objects
  • Round objects : In combination with support rings
  • 有限的可访问性：带有影响装置LEEB DC和DL
  • 光对象：带冲击装置LEEB C.
  • Very hard objects : With impact devices Leeb S and E
  • 铸造物体：带有影响装置LEEB G
  • 抛光对象：带有影响装置LEEB C.
  • Additional Applications :
    • Fire damage assessment
    • Engine cylinder
    • 狭窄的汽车部件
    • Aluminium castings
    • Steel rolls
    • 海洋工业
    • Transmission gears
    • Rolling mills
    • Leeb and Portable Rockwell combined
    • Automotive system integration
    • 热切割
    • 定子楔子

概述

你的好处
Combine with Leeb and Portable Rockwel 使用完整的LEEB探测器产品组合，并与便携式罗克韦尔和UCI相结合
On-screen feedback to reduce measurement inaccuracies caused by the operator Comes with the high accuracy known for all Equotip products
通过强大的内置报告功能即可报告即可报告 通过强大的内置报告功能即可报告即可报告

Native Scale

HL

Measuring Range

150 – 950 HL

测量精度

±4 HL（800 HL 0.5％）

Available Scales

HB，HV，HRA，HRB，HRC，HS，MPA

Available Probes

Leeb D / DC / DL / S / E / G / C

Combination With Other Methods

便携式罗克韦尔，UCI

平均粗糙度Ra（μm/μInch）

7/275（LEEB G）

最小质量（kg / lbs）

0.02 / 0.045 (Leeb C)

Minimum Thickness (mm / inch)

1 / 0.04 (Leeb C)

特征

仪器固件
  • Automatic compensation for impact direction
  • Personalized user profiles and views
  • 集成在自动化测试环境中（包括遥控器）
  • 11 Languages and timezone supported

PC Software

Equotip Link allowing direct reporting and custom reports

Display

7“彩色螺纹触摸屏单元（800 x 480像素），具有双核处理器

内存

内部8 GB闪存（> 1'000 000测量）

连接

USB主机/设备和以太网

Standardization

Standards
  • ASTM A 956
  • ASTM E 140.
  • ASTM A 370
  • ISO 16859
  • DIN 50156
  • GB / T 17394
  • JB / T 9378

指导方针

  • ASME CRTD-91
  • DGZFP指南MC 1
  • VDI / VDE指南2616纸张1
  • NORDTEST技术报告424-1,424-2，424-3

Accessories

测量配件
  • Equotip LEEB冲击装置D（356 00 100）
  • Equotip LEEB冲击装置E（356 00 400）
  • Equotip Leeb Impact Device G (356 00 300)
  • 一套支持戒指12个。对于D / DC / C / E / S）（353 03 000）
  • Battery complete (327 01 033)
  • 快速充电器（外部）（327 01 053）
  • 2-in-1 Kits Special Offers: Equotip 550 Portable Rockwell & Leeb D Kit (356 10 021), Equotip 550 Leeb D & UCI Kit (356 10 022)

Verification Tools

  • Equotip Test Block E, ~810 HLE / ~63 HRC (357 14 400)
  • 单位测试块G，〜570 HLG /〜340 HB（357 32 300）
  • Equotip Test Block D/DC, ~775 HLD / ~56 HRC (357 13 100)

资源

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